副教授
博士生导师
硕士生导师
NEU surface defect database
Kechen Song and Yunhui Yan
Description: |
In the Northeastern University (NEU) surface defect database, six kinds of typical surface defects of the hot-rolled steel strip are collected, i.e., rolled-in scale (RS), patches (Pa), crazing (Cr), pitted surface (PS), inclusion (In) and scratches (Sc). The database includes 1,800 grayscale images: 300 samples each of six different kinds of typical surface defects. Fig. 1 shows the sample images of six kinds of typical surface defects, the original resolution of each image is 200×200 pixels. From Fig. 1, we can clearly observe that the intra-class defects existing large differences in appearance, for instance, the scratches (the last column) may be horizontal scratch, vertical scratch, and slanting scratch, etc. Meanwhile the inter-class defects have similar aspects, e.g., rolled-in scale, crazing, and pitted surface. In addition, due to the influence of the illumination and material changes, the grayscale of the intra-class defect images is varied. In short, the NEU surface defect database includes two difficult challenges, i.e., the intra-class defects existing large differences in appearance while the inter-class defects have similar aspects, the defect images suffer from the influence of illumination and material changes. Fig.1 NEU-CLS For defect detection task, we provided annotations which indicate the class and location of a defect in each image. We have carefully clicked annotations of each target in these images. Fig. 2 shows some examples of detection results on NEU-DET. For each defect, the yellow box is the bounding box indicating its location and the green label is the class score. Fig.2 NEU-DET |
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Citation: Yanqi Bao, Kechen Song, Jie Liu, Yanyan Wang, Yunhui Yan, Han Yu, Xingjie Li, “Triplet- Graph Reasoning Network for Few-shot Metal Generic Surface Defect Segmentation,” IEEE Transactions on Instrumentation and Measuremente, 2021.(paper) Yu He, Kechen Song, Qinggang Meng, Yunhui Yan, “An End-to-end Steel Surface Defect Detection Approach via Fusing Multiple Hierarchical Features,” IEEE Transactions on Instrumentation and Measuremente, 2020,69(4),1493-1504.(paper)
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