Xingsheng Wang
·Paper Publications
Multi-level RTN with Certain Regularities in Oxide-RRAM: Experiments, Defect Dynamics and 3D Multi-Physics Modeling
Release time:2024-12-18 Hits:
Indexed by: Essay collection
First Author: Dejiang Mu,Pan Liu
Correspondence Author: Xingsheng Wang
Co-author: Zijian Zhou,Zifei Cai,Jian Zhang,Kan-Hao Xue,Zhigang Ji,Xiangshui Miao
Journal: 2025 IEEE International Reliability Physics Symposium (IRPS)
Included Journals: EI
Date of Publication: 2024-12-18