Time: 16:00, 9/23/2011

Place: Room A306, Qujiang campus

Speaker: Professor Tamás Ungár

Title: The microstructure in terms of size, strain and faulting determined by diffraction line profile analysis

Abstract:

Diffraction line profiles can broaden, can be asymmetric, can be shifted, and these features can be anisotropic in terms of hkl indices. The potential of diffraction line profile analysis will be revealed by discussing the correlation between the diffraction patterns and the microstructure of plastically deformed metals, nanocrystalline materials, an MgSiO3 perovskite, and other materials.