处理器可靠性约束的电压频率岛NoC 能耗优化
Hits:
Title of Paper:处理器可靠性约束的电压频率岛NoC 能耗优化
Journal:电子与信息学报
Indexed by:Journal paper
Document Code:EI:20114214431736
Volume:33
Issue:9
Page Number:2205-2211
Translation or Not:no
Date of Publication:2011-09-05
Included Journals:EI