一种基于表面等离子体共振技术的磁场测量方法

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Patent Applicant:英宇(S)

Note:专利证书编号:ZL 2015 1 0221077.6

Service Invention or Not:no

Application Date:2015-05-05

Publication Date:2015-10-21

Authorization Date:2018-03-30

First Author:Zhao Yong