双光源微小位移的测量方法

• Affilication of Author(s):东北大学
• Teaching and Research Group:理学院物理系
• Type of Patent:国家发明专利
• State of Patent:Authorized patents
• Application Number:ZL 2019 1 1009046.9
• Authorization number:CN 110864628 B
• Number of Inventors:5
• Service Invention or Not:yes
• Application Date:2019-10-23
• Publication Date:2021-02-19
• Authorization Date:2021-02-19