Xingsheng Wang
Paper Publications
Drain Bias Effects on Statistical Variability and Reliability and Related Subthreshold Variability in 20-nm Bulk Planar MOSFETs
Release time:2018-06-07 Hits:
Indexed by:Journal paper
First Author:Xingsheng Wang
Correspondence Author:Xingsheng Wang
Co-author:X. Wang, A. R. Brown, B. Cheng, S. Roy,A. Asenov
Journal:Solid-State Electronics
Included Journals:EI、SCI
Discipline:Engineering
First-Level Discipline:Electronic Science And Technology
Volume:98
Page Number:99–105
Date of Publication:2014-08-01