·Paper Publications
-
Pre One::
Yi Li*, Kangsheng Yin, Meiyun Zhang, Long Cheng, Ke Lu, Shibing Long*, Yaxiong Zhou, Zhuorui Wang, Kanhao Xue, Ming Liu, and Xiangshui Miao*, Correlation analysis between the current fluctuation characteristics and the conductive filament morphology of HfO2-based memristor, Applied Physics Letters, 111, 213505, 2017.
-
Next One::
Ya-Xiong Zhou,† Yi Li,† Yu-Ting Su, Zhuo-Rui Wang, Ling-Yi Shih, Ting-Chang Chang,* Kuan-Chang Chang, Shi-Bing Long, Simon M. Sze, and Xiang-Shui Miao,* Nonvolatile reconfigurable sequential logic in HfO2 resistive random access memory array, Nanoscale, 9, 6649-6657, 2017. (Inside front cover)