[5] Chen Jiang, Manuel A Vega, Michael D Todd, Zhen Hu. Model correction and updating of a stochastic degradation model for failure prognostics of miter gates. Reliability Engineering & System Safety, 2022, 218: 108203.
Release time:2023-06-15
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- Pre One:[4] Chen Jiang, Manuel A Vega, Mukesh K Ramancha, Michael D Todd, Joel P Conte, Matthew Parno, Zhen Hu. Bayesian calibration of multi-level model with unobservable distributed response and application to miter gates. Mechanical Systems and Signal Processing, 2022, 170: 108852.
- Next One:[6] Zhuo Wang #, Chen Jiang #, Pengwei Liu, Wenhua Yang, Ying Zhao, Mark F Horstemeyer, Long-Qing Chen, Zhen Hu, Lei Chen. Uncertainty quantification and reduction in metal additive manufacturing. npj Computational Materials, 2020, 6: 1-10.