Paper Publications
Grain scattering noise modelling and its use in the detection and characterization of defects using ultrasonic arrays
Release time:2020-06-15 Hits:
Indexed by:Journal paper
First Author:Long Bai
Correspondence Author:Long Bai
Co-author: Alexander Velichko,Bruce W. Drinkwater
Journal:IEEE TRANSACTIONS ON ULTRASONICS, FERROELECTRICS, AND FREQUENCY CONTROL
Included Journals:SCI
Volume:66
Issue:11
Page Number:1798-1813
Date of Publication:2019-07-08
Links to published journals:https://ieeexplore.ieee.org/document/8756271