1、个人基本信息：

姓  名：蔡烁

性  别：男

出生年月：1982年10月

技术职称：教授

毕业院校：湖南大学

学历（学位）：博士

所在学科：计算机科学与技术、信息与通信工程

研究方向：容错计算、电路系统可靠性、集成电路抗辐射加固设计、人工智能、物联网可靠性

2、教育背景：

2000.9-2004.6

浙江大学

信息工程，学士

2004.9-2007.6

湖南大学

信号与信息处理，硕士

2010.9-2015.4

湖南大学

计算机科学与技术，博士

3、目前研究领域：

容错计算、近似计算、电路系统可靠性、集成电路抗辐射加固、人工智能、物联网可靠性。

4、已完成或已在承担的主要课题：

[1] 国家自然科学基金面上项目：基于相关性分离的逻辑电路失效率高效分析与敏感目标精准定位，2022.1-2025.12，No：62172058，主持，在研；

[2] 湖南省自然科学基金杰出青年基金项目：空间辐射环境下纳米集成电路可靠性评估与加固设计，2022.1-2024.12，No：2022JJ10052，主持，在研；

[3] 湖南省自然科学基金面上项目：面向逻辑级超大规模集成电路软错误率分析方法研究，2020.1-2022.12，主持，No：2020JJ4622，主持，已完成；

[4] 国家自然科学基金青年项目：逻辑级破解纳米集成电路软错误可靠性评估难题的新方法，2018.1-2020.12，No：61702052，主持，已完成；

[5] 湖南省教育厅重点项目：空间辐射环境下纳米集成电路瞬态故障分析与可靠性评估，2019.9-2021.8，No：18A137，主持，已完成；

[6] 湖南省水利科技项目：大坝病害快速诊断与动态风险控制决策研究，2020.7-2022.6，No：XSKJ2019081-47，主持，已完成。

6、已发表的学术论文：

[1] 蔡烁*, 何辉煌, 余飞, 尹来容, 刘洋. 基于相关性分离的逻辑电路敏感门定位算法. 电子与信息学报. 2024, 46(1): 362-372

[2] Shuo Cai*, Yan Wen, Caicai Xie, Weizheng Wang, Fei Yu. Low-power and high-speed SRAM Cells for Double-Node-Upset Recovery. Integration, the VLSI Journal. 2023, 91:1-9

[3] Shuo Cai*, Yan Wen, Jiangbiao Ouyang, Weizheng Wang, Fei Yu, Bo Li. A Highly Reliable and Low-Power Cross-Coupled 18T SRAM Cell. Microelectronics Journal. 2023, 134:105729:1-7

[4] Shuo Cai, Tingyu Luo, Fei Yu*, Pradip Kumar Sharma, Weizheng Wang, Lairong Yin. Reliability Analysis of Correlated Competitive and Dependent Components Considering Random Isolation Times. CMC: Computer, Materials & Continua. 2023, 76(3): 2763-2777

[5] Shuo Cai*, Jiangbiao Ouyang, Yan Wen, Weizheng Wang, Fei Yu. A Low-Delay Quadruple-Node-Upset Self-Recoverable Latch Design. 2023 IEEE 32nd Asian Test Symposium(ATS), Beijing, China, 2023,10.14-17: 1-5

[6] Shuo Cai*, Caicai Xie, Yan Wen, Weizheng Wang, Fei Yu, Lairong Yin. Four-input-C-element-based Multiple-Node-Upset-Self-Recoverable Latch Designs. Integration, the VLSI Journal. 2023, 90:11-21

[7] Shuo Cai*, Binyong He, Sicheng Wu, Jin Wang, Weizheng Wang, Fei Yu. An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation. Journal of Electronic Testing-Theory and Applications. 2022, 38(2): 165-180

[8] Shuo Cai*, Sicheng Wu, Weizheng Wang, Fei Yu, Lairong Yin. Sensitive Vector Search for Logic Circuit Failure Probability based on Improved Adaptive Cuckoo Algorithm. Journal of Semiconductor Technology and Science. 2022, 22(2): 69-83

[9] Fei Yu, Xinxin Kong, Huifeng Chen, Qiulin Yu, Shuo Cai*, Yuanyuan Huang, Sichun Du. A 6D Fractional-Order Memristive Hopfield Neural Network and its Application in Image Encryption. Frontiers in Physics. 2022, 10: 847385, 1-14

[10] Fei Yu, Huifeng Chen, Xinxin Kong, Qiulin Yu, Shuo Cai*, Yuanyuan Huang, Sichun Du. Dynamic Analysis and Application in Medical Digital Image Watermarking of a New Multi-scroll Neural Network with Quartic Nonlinear Memristor. European Physical Journal Plus. 2022, 137(4): 434

[11] Shuo Cai*, Caicai Xie, Yan Wen, Weizheng Wang. A Low-Cost Quadruple-Node-Upset Self-Recoverable Latch Design. 5th IEEE International Test Conference in Asia, ITC-Asia 2021. 中国上海, 2021

[12] Shuo Cai*, Binyong He, Weizheng Wang, et al. Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults. Journal of Electronic Testing-Theory and Applications. 2020, 36(4): 469-483

[13] Shuo Cai*, Binyong He, Sicheng Wu, et al. An Accurate and Efficient Approach for Estimating the Failure Probability of Logic Circuits, 2020 CCF Integrated Circuit Design and Automation Conference, 2020: 1-15

[14] Shuo Cai*, Weizheng Wang, Fei Yu, Binyong He. Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits. Journal of Electronic Testing - Theory and Applications. 2019, 35(2): 163-172

[15] Shuo Cai*, Fei Yu, Yiqun Yang. Analysis of SET Pulses Propagation Probabilities in Sequential Circuits, 2017 the 4th International Conference on Advances in Electronics Engineering, 2017: 1-6

[16] Shuo Cai*, Yinbo Zhou, Peng Liu, Fei Yu, Wei Wang. A Novel Test Data Compression Approach Based on Bit Reversion. IEICE Electronics Express. 2017, 14(13): 1-11

[17] Shuo Cai*, Fei Yu, Weizheng Wang, Tieqiao Liu, Peng Liu, Wei Wang. Reliability Evaluation of Logic Circuits Based on Transient Faults Propagation Metrics. IEICE Electronics Express. 2017, 14(7): 1-7

[18] Cai Shuo, Kuang Jishun*, Liu Tieqiao, Wang Weizheng. Soft Error Susceptibility Analysis for Sequential Circuit Elements Based on EPPMs. Journal of Semiconductor Technology and Science. 2015, 15(2): 168-176

[19] 蔡烁*,邝继顺,张亮,刘铁桥,王伟征.基于差错传播概率矩阵的时序电路软错误可靠性评估.计算机学报. 2015, 38(5): 923-931

[20] 蔡烁*,邝继顺,刘铁桥,凌纯清,尤志强.基于伯努利分布的逻辑电路可靠度计算方法.电子学报. 2015, 43(11)：2292-2297

[21] 蔡烁*,邝继顺,刘铁桥,王伟征.考虑信号相关性的逻辑电路可靠度计算方法.电子学报.2014, 42(8): 1660-1664

[22] 蔡烁*,邝继顺,刘铁桥,周颖波.一种高效的门级电路可靠度估算方法.电子与信息学报. 2013, 35(5): 1262-1266

[23] 蔡烁*,胡航滔,王威.基于深度卷积网络的高分遥感图像语义分割.信号处理, 2019. 35(12): 2010-2016

7、 所获学术荣誉及学术影响：

[1] 湖南省杰出青年基金项目获得者

[2] 湖南省青年骨干教师培养对象

[3] 中国计算机学会高级会员

[4] 中国计算机学会容错计算专委会执行委员

[5] 中国通信学会会员

[6] 湖南省计算机学会理事

[7] 湖南省人工智能学会会员